Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces (Contributo in atti di convegno)

Type
Label
  • Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces (Contributo in atti di convegno) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Alternative label
  • Eriksson J, Roccaforte F, Weng MH, Lorenzzi J, Jegenyes N, Giannazzo F, Fiorenza P, Raineri V (2010)
    Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces
    in Conference of the E-MRS Symposium F Strasbourg, FRANCE, JUN 08-10, 2010, Strasburgo
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Eriksson J, Roccaforte F, Weng MH, Lorenzzi J, Jegenyes N, Giannazzo F, Fiorenza P, Raineri V (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. CNR IMM, I-95121 Catania, Italy (literal)
Titolo
  • Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces (literal)
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Autore CNR

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