http://www.cnr.it/ontology/cnr/individuo/prodotto/ID86932
Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors (Contributo in atti di convegno)
- Type
- Label
- Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors (Contributo in atti di convegno) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Alternative label
Valletta A., M. Rapisarda, L. Mariucci, A. Pecora, G. Fortunato, C. Caligiore, E. Fontana, F. Tramontana and S. Leonardi (2008)
Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors
in E-MRS 2008 Spring Meeting (May 26- 30, 2008, Strasbourg, France), Strasburgo
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Valletta A., M. Rapisarda, L. Mariucci, A. Pecora, G. Fortunato, C. Caligiore, E. Fontana, F. Tramontana and S. Leonardi (literal)
- Note
- ISI Web of Science (WOS) (literal)
- Titolo
- Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors (literal)
- Prodotto di
- Autore CNR
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- Prodotto