Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors (Contributo in atti di convegno)

Type
Label
  • Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors (Contributo in atti di convegno) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Alternative label
  • Valletta A., M. Rapisarda, L. Mariucci, A. Pecora, G. Fortunato, C. Caligiore, E. Fontana, F. Tramontana and S. Leonardi (2008)
    Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors
    in E-MRS 2008 Spring Meeting (May 26- 30, 2008, Strasbourg, France), Strasburgo
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Valletta A., M. Rapisarda, L. Mariucci, A. Pecora, G. Fortunato, C. Caligiore, E. Fontana, F. Tramontana and S. Leonardi (literal)
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Effective channel length and parasitic resistance determination in non self-aligned low-temperature polycrystalline silicon thin film transistors (literal)
Prodotto di
Autore CNR

Incoming links:


Autore CNR di
Prodotto
data.CNR.it