http://www.cnr.it/ontology/cnr/individuo/prodotto/ID86727
Observation of the nucleation kinetics of Si quantum dots On SiO2 by EFTEM (Contributo in atti di convegno)
- Type
- Label
- Observation of the nucleation kinetics of Si quantum dots On SiO2 by EFTEM (Contributo in atti di convegno) (literal)
- Anno
- 2003-01-01T00:00:00+01:00 (literal)
- Alternative label
Nicotra G, Lombardo S, Puglisi R, Spinella C, Ammendola G, Gerardi C (2003)
Observation of the nucleation kinetics of Si quantum dots On SiO2 by EFTEM
in Microscopy of Semiconducting Materials, Oxford UK
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Nicotra G, Lombardo S, Puglisi R, Spinella C, Ammendola G, Gerardi C (literal)
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#descrizioneSinteticaDelProdotto
- The formation of Si quantum dots on SiO2 by chemical vapour deposition of SiH4 is investigated in the range from the sub-monolayer to the complete coverage with Si. Energy filtered transmission electron microscopy is used to measure the dot size distributions. It is shown that this technique allows the measurement of size distributions down to dimensions of about Into. This capability allows the determination of some important microscopic features of the nucleation process, the consideration of which is fundamental to control the Si dot size. (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- IMM-CNR Catania;
STMicroelectronics Catania (literal)
- Titolo
- Observation of the nucleation kinetics of Si quantum dots On SiO2 by EFTEM (literal)
- Prodotto di
- Autore CNR
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