Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches (Contributo in atti di convegno)

Type

• Contributo in atti di convegno (Classe)
• Prodotto della ricerca (Classe)

Label

• Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches (Contributo in atti di convegno) (literal)

Anno

• 2006-01-01T00:00:00+01:00 (literal)

Alternative label

• Simone Catoni, Sergio Di Nardo, Paola Farinelli, Flavio Giacomozzi, Giovanni Mannocchi, Romolo Marcelli, Benno Margesin, Paolo Mezzanotte, Viviana Mulloni, Roberto Sorrentino, Francesco Vitulli, Larissa Vietzorreck (2006)
  Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches
  in 7th Workshop on MEMS for Millimeter Wave Communications, MEMSWAVE 2006, Orvieto, June 27-29, 2006
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Simone Catoni, Sergio Di Nardo, Paola Farinelli, Flavio Giacomozzi, Giovanni Mannocchi, Romolo Marcelli, Benno Margesin, Paolo Mezzanotte, Viviana Mulloni, Roberto Sorrentino, Francesco Vitulli, Larissa Vietzorreck (literal)

Pagina inizio

• 123 (literal)

Pagina fine

• 126 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

• http://books.google.it/books/about/MEMSWAVE_2006_MEMSWAVE_Conference_Palazz.html?id=DOJuNQEACAAJ&redir_esc=y (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume

• Proceedings of the 7th Workshop on MEMS for Millimeter Wave Communications, MEMSWAVE 2006 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 4 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR-IMM Roma Thales Alenia Space Italia, Roma e L'Aquila UNIVERSITY of Perugia TUM Munchen,Germany FBK-irst, Trento (literal)

Titolo

• Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autoriVolume

• AA.VV. (literal)

Abstract

• Abstract -- RF MEMS series and shunt switches in coplanar waveguide configuration have been tested to check their reliability in terms of the technological yield, the number of cycles and the total time during which they are actuated. Cycles up to 5×10^8 and total actuation times of 5×10^5 sec have been measured for series configurations by using short pulses. More than one week of operation has been experienced on a shunt device. Power handling has been also considered, and purposely designed switches were able to handle powers up to 5 watt. (literal)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)

Autore CNR

• ROMOLO MARCELLI (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ROMOLO MARCELLI (Unità di personale interno)

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• http://www.cnr.it/ontology/cnr/individuo/modulo/ID2035

Insieme di parole chiave di

• Parole chiave di "Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches" (Insieme di parole chiave)