http://www.cnr.it/ontology/cnr/individuo/prodotto/ID85817
Multiple slit interference and diffraction (Contributo in atti di convegno)
- Type
- Label
- Multiple slit interference and diffraction (Contributo in atti di convegno) (literal)
- Anno
- 2009-01-01T00:00:00+01:00 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Frabboni S.; Frigeri C.; Gazzadi G. C.; Pozzi G. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
- In: MC2009 - 9th Multinational Conference on Microscopy 2009 (Graz (A), 30 Aug. - 04 Sept. 2009). Proceedings, pp. 283 - 284. Verlag der TU Graz, 2009. (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#descrizioneSinteticaDelProdotto
- ABSTRACT: The recent advances in nanotechnology and electron microscopy are making today possible the realization of experiments of diffraction and interference at multiple slits which formerly were carried out with extremely skilled specimen preparation techniques and dedicated electron optical apparatus [1]. Recently we have used the focused ion beam (FIB) to fabricate two slits on a commercial silicon nitride membrane suspended on a 100x100μm2 window realized on a 200μm thick silicon substrate, and observe the Fraunhofer image in a conventional TEM-JEOL 2010 [2]. Here we adopt a less expensive support for nano slits fabrication, consisting of a commercial continuous carbon film on a standard copper grid, which was subsequently evaporated with a gold layer about 120 nm in thickness. The slits (nominally 80nm wide, 420 nm spaced) were fabricated with a 9 pa, 30keV, Ga+ beam of a FEI Strata235M dual beam. The quality of the slits is really excellent, as shown in Fig. 1, which (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Department of Physics, University of Modena and Reggio Emilia, Modena, Italy, CNR-IMEM, Parma, CNR-INFM, Modena - S3, Department of Physics, University of Bologna, Bologna, Italy (literal)
- Titolo
- Multiple slit interference and diffraction (literal)
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- Autore CNR
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