http://www.cnr.it/ontology/cnr/individuo/prodotto/ID85810

Pulsed electron deposition (PED) of single buffer layer for 'low-cost' YBCO coated conductors (Contributo in atti di convegno)

Type

Label

Pulsed electron deposition (PED) of single buffer layer for 'low-cost' YBCO coated conductors (Contributo in atti di convegno) (literal)

Anno

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

Alternative label

Gilioli E.; Baldini M.; Bindi M.; Bissoli F.; Calestani D.; Pattini F.; Rampino S.; Rocca M.; Zannella S.; Woerdenweber R. (2008)
Pulsed electron deposition (PED) of single buffer layer for 'low-cost' YBCO coated conductors
in 8th European Conference on Applied Superconductivity, Brussels, Belgium, 16-20 September 2007
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Gilioli E.; Baldini M.; Bindi M.; Bissoli F.; Calestani D.; Pattini F.; Rampino S.; Rocca M.; Zannella S.; Woerdenweber R. (literal)

Pagina inizio

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

Rivista

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note

In: EUCAS2007 - 8th European Conference on Applied Superconductivity (Brussels, Belgium, 16-20 September 2007). Proceedings, vol. 97 article n. 012197. (Journal of Physics: Conference Series). IOP Publishing Ltd, 2008. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#descrizioneSinteticaDelProdotto

ABSTRACT: The challenge for the commercialization of YBCO Coated Conductors (CC) is the development of a low cost manufacturing process to allow for a cheap, fast and continuous deposition of superconducting coatings with high electrical performance. We are currently investigating 2 ways to reduce the CC production costs: i) reducing the complexity of the CC architecture, by growing a single buffer layer based on doped CeO2, and ii) utilizing a new reel-to-reel apparatus for long length CC processing, equipped with a cheap and reliable deposition system (PED, Pulsed Electron Deposition). In this work we report on the successful continuous deposition of very thick (up to 700 nm) doped-CeO2 single buffer layers on biaxially textured Ni-5at%W substrates by PED. XRD patterns display complete orientation and very good texture quality of our samples (FWHM out-of-plane values of approx 6°), over 20 cm length. Optical and electron microscopy show a dense and crack-free film surface and dielectric strength measurement confirms excellent insulating properties. Preliminary results indicate that the simplified single buffer layer structure could be a reliable solution for the reduction of HTS CC production costs. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

CNR-IMEM, Parma, Edison S.p.A., 20121 Milan, Italy, CNR-IMEM, Genova, CNR-IMEM, Genova and DIFI-University of Genoa, 16146 Genoa, Italy, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany (literal)

Titolo

Pulsed electron deposition (PED) of single buffer layer for 'low-cost' YBCO coated conductors (literal)

Abstract

The challenge for the commercialization of YBCO Coated Conductors (CC) is the development of a low cost manufacturing process to allow for a cheap, fast and continuous deposition of superconducting coatings with high electrical performance. We are currently investigating 2 ways to reduce the CC production costs: i) reducing the complexity of the CC architecture, by growing a single buffer layer based on doped CeO2, and ii) utilizing a new reel-to-reel apparatus for long length CC processing, equipped with a cheap and reliable deposition system (PED, Pulsed Electron Deposition). In this work we report on the successful continuous deposition of very thick (up to 700 nm) doped-CeO2 single buffer layers on biaxially textured Ni-5at%W substrates by PED. XRD patterns display complete orientation and very good texture quality of our samples (FWHM out-of-plane values of approx 6°), over 20 cm length. Optical and electron microscopy show a dense and crack-free film surface and dielectric strength measurement confirms excellent insulating properties. Preliminary results indicate that the simplified single buffer layer structure could be a reliable solution for the reduction of HTS CC production costs (literal)

Prodotto di