Accelerated testing of rf-mems contact degradation through radiation sources (Contributo in atti di convegno)

Type
Label
  • Accelerated testing of rf-mems contact degradation through radiation sources (Contributo in atti di convegno) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Alternative label
  • A. Tazzoli, M. Barbato, V. Giliberto, G. Monaco, S. Gerardin, P. Nicolosi, A. Paccagnella, G. Meneghesso (2010)
    Accelerated testing of rf-mems contact degradation through radiation sources
    in IEEE International Reliability Physics Symposium, Anaheim, California
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • A. Tazzoli, M. Barbato, V. Giliberto, G. Monaco, S. Gerardin, P. Nicolosi, A. Paccagnella, G. Meneghesso (literal)
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Accelerated testing of rf-mems contact degradation through radiation sources (literal)
Prodotto di
Autore CNR

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Prodotto
Autore CNR di
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