Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions (Articolo in rivista)

Type
Label
  • Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions (Articolo in rivista) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1116/1.2194944 (literal)
Alternative label
  • Pelucchi, E; Kumar, D; Lazzarino, M; Rubini, S; Franciosi, A (2006)
    Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions
    in Journal of vacuum science & technology. B, Microelectronics and nanometer structures
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Pelucchi, E; Kumar, D; Lazzarino, M; Rubini, S; Franciosi, A (literal)
Pagina inizio
  • 1259 (literal)
Pagina fine
  • 1265 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 24 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Lab Nazl TASC INFM, I-34012 Trieste, Italy (literal)
Titolo
  • Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions (literal)
Abstract
  • Transport studies of patterned Au/ZnSSe(001) contacts fabricated by molecular beam epitaxy reveal substantial lateral inhomogeneities in the Schottky barrier height. The x-ray photoemission results provide evidence of chemical reactions at a number of preferential, surface sites. Incorporation of ultrathin Zn interlayers between the ZnSe substrate and the Au overlayer decreases the value of the n-type Schottky barrier height from 1.62 to 1.05 eV and eliminates all evidence of lateral inhomogeneities in the barrier height. The interlayer-induced Schottky barrier tunability is found to be primarily limited by Zn-Au alloying within the overlayer. (c) 2006 American Vacuum Society. (literal)
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