The structure of ZnWO4/ZnO films probed by XEOL-SNOM technique (Contributo in atti di convegno)

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  • The structure of ZnWO4/ZnO films probed by XEOL-SNOM technique (Contributo in atti di convegno) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Alternative label
  • F. Rocca, S. Larcheri, A. Kuzmin, R. Kalendarev, J. Purans, R. Graziola, G.Dalba, F. Jandard, D. Pailharey (2008)
    The structure of ZnWO4/ZnO films probed by XEOL-SNOM technique
    in SILS 2008 - XVI Convegno della Società Italiana di Luce di Sincrotrone, Palermo (Italy)
    (literal)
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  • F. Rocca, S. Larcheri, A. Kuzmin, R. Kalendarev, J. Purans, R. Graziola, G.Dalba, F. Jandard, D. Pailharey (literal)
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  • Abstract: The knowledge of the local structure of nanocrystalline thin films is crucial for the understanding and the optimization of their functional properties. Due to the films inhomogeneity, often the nano-grains forming the film have different sizes, phase contents and internal structures. The volume averaging can hide local level deviations, because the properties of individual grains may deviate from the average ones. Therefore, special local sensitive methods, having nanoscale resolution, are required for adequate investigation of nanocrystalline thin films. We present a study on the nanocrystalline structure of mixed ZnWO4/ZnO thin film, prepared by reactive dc magnetron co-sputtering. The film, which shows a very intense photoluminescence under UV and X-ray excitation, has been studied by several experimental techniques as x-ray diffraction, laser confocal spectro-microscopy, and XEOL-SNOM x-ray absorption spectroscopy (XAS), a recently developed novel technique(1), which couples synchrotron radiation and scanning near-field optical microscopy (SNOM) to detect the x-ray excited optical luminescence (XEOL). The last method allows the simultaneous acquisition of topographic and chemical information with the sub wavelength spatial resolution determined by the SNOM probe aperture. The obtained results indicate that the films are composed of grains having inhomogeneous distribution of nanocrystalline ZnWO4 and ZnO phases. The presence of the ZnO phase is unambiguously detected only at the nano-scale by XAS-SNOM method that emphasizes the difference between average macroscopic and local nanoscale structures. Moreover, the analysis of the Zn K-edge XANES shows that ZnO nanocrystals exist in both wurtzite-type and high-pressure rock-salt-type phases. (1) X-ray Exited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience, S. Larcheri, F. Rocca, F. Jandard, D. Pailharey, R. Graziola,A. Kuzmin and J. Purans, Review of Scientific Instruments 79 (2008) 013702 (literal)
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  • F. Rocca,1 S. Larcheri,1,3 A. Kuzmin,2 R. Kalendarev,2 J. Purans,2 R. Graziola,3 G.Dalba,,3 F. Jandard,4 D. Pailharey4 1 IFN-CNR, Institute for Photonics and Nanotechnologies, Unit “FBK CeFSA”, Via alla Cascata 56/c, 38100 Povo (Trento), (I) 2 Institute of Solid State Physics, University of Latvia, Riga (LV) 3 Dipartimento di Fisica, Università di Trento, Povo(Trento), (I) 4 CRMC-N and Université de la Mediterranée, Marseille (F) (literal)
Titolo
  • The structure of ZnWO4/ZnO films probed by XEOL-SNOM technique (literal)
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