Characterization of a Novel and Widely-Tunable Yb:KYF4 Laser for Optical Frequency Metrology (Contributo in atti di convegno)

Type
Label
  • Characterization of a Novel and Widely-Tunable Yb:KYF4 Laser for Optical Frequency Metrology (Contributo in atti di convegno) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • G. Galzerano, P. Laporta, E. Sani, L. Bonelli, A. Toncelli, M. Tonelli, M. Norgia, A. Pesatori, C. Svelto (2007)
    Characterization of a Novel and Widely-Tunable Yb:KYF4 Laser for Optical Frequency Metrology
    in Instrumentation and Measurement Technology Conference Proceedings
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • G. Galzerano, P. Laporta, E. Sani, L. Bonelli, A. Toncelli, M. Tonelli, M. Norgia, A. Pesatori, C. Svelto (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Instrumentation and Measurement Technology Conference Proceedings, 2007 IEEE 1-3 May 2007, p. 4258421 (literal)
Titolo
  • Characterization of a Novel and Widely-Tunable Yb:KYF4 Laser for Optical Frequency Metrology (literal)
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