Soft X-ray Contact Imaging of Thin Films by a laser plasma source (Contributo in atti di convegno)

Type
Label
  • Soft X-ray Contact Imaging of Thin Films by a laser plasma source (Contributo in atti di convegno) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • S. Stagira, F. Calegari, E. Benedetti, J. Cabanillas, M. Nisoli, G. Sansone, G. Valentini, C. Vozzi, S. De Silvestri, L. Poletto, P. Villoresi, A. Faenov, T. Pikuz (2007)
    Soft X-ray Contact Imaging of Thin Films by a laser plasma source
    in 2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), Baltimora, USA., MAY 06-11, 2007
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • S. Stagira, F. Calegari, E. Benedetti, J. Cabanillas, M. Nisoli, G. Sansone, G. Valentini, C. Vozzi, S. De Silvestri, L. Poletto, P. Villoresi, A. Faenov, T. Pikuz (literal)
Pagina inizio
  • 709 (literal)
Pagina fine
  • 710 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume
  • 2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#volumeInCollana
  • 1-5 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy Kansai Photon Science Institute, Japan Atomic Energy Agency (JAEA), Kizu-cho, Kyoto, Japan and Institute for High Energy Density of JIHT,RAS, Moscow, Russia Laboratory for Ultraviolet and X-Ray Optical Research - CNR-INFM, DEI, Padua University, Padua, Italy (literal)
Titolo
  • Soft X-ray Contact Imaging of Thin Films by a laser plasma source (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn
  • 978-1-4244-3590-6 (literal)
Abstract
  • Quantitative analysis of nanometric films is achieved by soft X-ray imaging using a laser-plasma source and LiF crystals as detectors. Excitation of color center fluorescence in exposed LiF allows image detection with sub-micron resolution (literal)
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