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Table-top soft x-ray imaging of nanometric films (Articolo in rivista)

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Table-top soft x-ray imaging of nanometric films (Articolo in rivista) (literal)

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Calegari, F; Stagira, S; D'Andrea, C; Valentini, G; Vozzi, C; Nisoli, M; De Silvestri, S; Poletto, L; Villoresi, P; Faenov, A; Pikuz, T (2006)
Table-top soft x-ray imaging of nanometric films
in Applied physics letters
(literal)

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Calegari, F; Stagira, S; D'Andrea, C; Valentini, G; Vozzi, C; Nisoli, M; De Silvestri, S; Poletto, L; Villoresi, P; Faenov, A; Pikuz, T (literal)

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Politecn Milan, Dipartimento Fis, INFM, CNR,Natl Lab Ultrafast & Ultraintense Opt Sci, I-20133 Milan, Italy; Univ Padua, DEI,INFM, CNR, Lab Ultraviolet & XRay Opt Res, I-35131 Padua, Italy; Russian Acad Sci, Inst High Energy Dens, Moscow MISDC VNIIFTRI Mendeleevo, Moscow 141570, Russia (literal)

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Abstract

Profiles of nanometric aluminum and parylene foils have been characterized by soft x-ray contact imaging using a laser-plasma source and a LiF crystal as detector. Due to the characteristic emission of this source in a 2 pi angle, it was possible to obtain the sample image in a wider field of view with respect to coherent sources. LiF crystal is a cheap and robust imaging detector for soft x-ray radiation, that allows one to get high spatial resolution images of thin films with thickness from hundreds down to a few tens of nanometers. (c) 2006 American Institute of Physics. (literal)

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