Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study (Articolo in rivista)

Type
Label
  • Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1021/nn101116n (literal)
Alternative label
  • Locatelli, Andrea; Knox, Kevin R.; Cvetko, Dean; Mentes, Tevfik Onur; Nino, Miguel Angel; Wang, Shancai; Yilmaz, Mehmet B.; Kim, Philip; Osgood, Richard M., Jr.; Morgante, Alberto (2010)
    Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study
    in ACS nano; ACS, American chemical society, Washington, DC (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Locatelli, Andrea; Knox, Kevin R.; Cvetko, Dean; Mentes, Tevfik Onur; Nino, Miguel Angel; Wang, Shancai; Yilmaz, Mehmet B.; Kim, Philip; Osgood, Richard M., Jr.; Morgante, Alberto (literal)
Pagina inizio
  • 4879 (literal)
Pagina fine
  • 4889 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://pubs.acs.org/doi/pdfplus/10.1021/nn101116n (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 4 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. Sincrotrone Trieste SCpA, Elettra, I-34149 Trieste, Italy 2. Columbia Univ, Dept Phys, New York, NY 10027 USA 3. Columbia Univ, Dept Appl Phys, New York, NY 10027 USA 4. IOM CNR Lab TASC, I-34149 Trieste, Italy 5. Univ Ljubljana, Fac Math & Phys, Ljubljana, Slovenia 6. Renmin Univ China, Dept Phys, Beijing, Peoples R China 7. Fatih Univ, Dept Phys, TR-34500 Istanbul, Turkey 8. Univ Trieste, Dept Phys, Trieste, Italy (literal)
Titolo
  • Corrugation in Exfoliated Graphene: An Electron Microscopy and Diffraction Study (literal)
Abstract
  • Low-energy electron microscopy and microprobe diffraction are used to image and characterize corrugation in SiO(2)-supported and suspended exfoliated graphene at nanometer length scales. Diffraction line-shape analysis reveals quantitative differences in surface roughness on length scales below 20 nm which depend on film thickness and interaction with the substrate. Corrugation decreases with increasing film thickness, reflecting the increased stiffness of multilayer films. Specifically, single-layer graphene shows a markedly larger short-range roughness than multilayer graphene. Due to the absence of interactions with the substrate, suspended graphene displays a smoother morphology and texture than supported graphene. A specific feature of suspended single-layer films is the dependence of corrugation on both adsorbate load and temperature, which is manifested by variations in the diffraction line shape. The effects of both intrinsic and extrinsic corrugation factors are discussed. (literal)
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