Impedance spectroscopy study of relaxor ferroelectric PLZT thin films obtained by PLD and RF-PLD (Contributo in atti di convegno)

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  • Impedance spectroscopy study of relaxor ferroelectric PLZT thin films obtained by PLD and RF-PLD (Contributo in atti di convegno) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1088/1757-899X/8/1/012003 (literal)
Alternative label
  • F. Craciun (1); M. Dinescu (2); N.D. Scarisoreanu (2); C. Capiani (3); C. Galassi (3); E. Morintale (4) (2010)
    Impedance spectroscopy study of relaxor ferroelectric PLZT thin films obtained by PLD and RF-PLD
    in Conference on Fundamentals and Technology of Multifunctional Oxide Thin Films (Symposium G, E-MRS 2009 Spring Meeting), Strasbourg, France, 8-12 June, 2009
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • F. Craciun (1); M. Dinescu (2); N.D. Scarisoreanu (2); C. Capiani (3); C. Galassi (3); E. Morintale (4) (literal)
Pagina inizio
  • 012003 (literal)
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  • Session: Processing, and Characterization of Ferroelectric and Multiferroic thin films. (literal)
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  • http://iopscience.iop.org/1757-899X/8/1/012003 (literal)
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  • Conference on Fundamentals and Technology of Multifunctional Oxide Thin Films (Symposium G, EMRS 2009 Spring Meeting) (literal)
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  • 8 (literal)
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  • IOP Conference Series: v.8: Fundamentals and Technology of Multifunctional Oxide Thin Films (Symposium G, E-MRS 2009 Spring Meeting), 8–12 June 2009, Strasbourg, France. Session: Processing, and Characterization of Ferroelectric and Multiferroic thin films. IOP Publishing. (literal)
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  • 4 (literal)
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  • 1 (literal)
Note
  • ISI Web of Science (WOS) (literal)
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  • (1) CNR-ISC, Istituto dei Sistemi Complessi, Via del Fosso del Cavaliere 100, I-00133 Rome, Italy (2) NILPRP, Bucharest, PO Box MG-16, RO-76900, Romania (3) CNR-ISTEC, Via Granarolo 64, I-48018 Faenza, Italy (4) University of Craiova, Faculty of Physics, 13 A. Cuza, RO-200585, Craiova, Romania (literal)
Titolo
  • Impedance spectroscopy study of relaxor ferroelectric PLZT thin films obtained by PLD and RF-PLD (literal)
Abstract
  • Ac conductivity of (Pb0.67La0.22)(Zr0.2Ti0.8)O3 thin films has been investigated by impedance spectroscopy. Thin films have been grown by pulsed laser deposition (PLD) and by PLD assisted by radiofrequency discharge in oxygen. A cubic perovskite structure similar to that of the target has been found by XRD analysis. The ac conductivity of the films has been studied as a function of the frequency, ac driving field and dc bias field amplitudes. We found a power law dependence on frequency at short time scale (high frequencies) and/or low field amplitude, while at low frequencies and/or high field amplitude the dc conductivity contribution was dominant. Measurements at high dc field (up to 150 kV/cm) indicate that films grown by RF-PLD have the ac conductivity decreased by one order of magnitude with respect to PLD-grown films. (literal)
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