http://www.cnr.it/ontology/cnr/individuo/prodotto/ID57596

Fiber-top atomic force microscope probe with optical near-field detection capabilities (Articolo in rivista)

Type

Label

Fiber-top atomic force microscope probe with optical near-field detection capabilities (Articolo in rivista) (literal)

Anno

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

Alternative label

B. Tiribilli (1); G. Margheri (1); P. Baschieri (2); C. Menozzi (3); D. Chavan (4); D. Iannuzzi (4) (2011)
Fiber-top atomic force microscope probe with optical near-field detection capabilities
in Journal of microscopy (Print); WILEY-BLACKWELL, MALDEN 02148,MA (Stati Uniti d'America); Royal microscopical society, Oxford (Regno Unito)
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

B. Tiribilli (1); G. Margheri (1); P. Baschieri (2); C. Menozzi (3); D. Chavan (4); D. Iannuzzi (4) (literal)

Pagina inizio

Pagina fine

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

http://onlinelibrary.wiley.com/doi/10.1111/j.1365-2818.2010.03476.x/abstract (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

Rivista

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

Note

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

1) Institute of Complex Systems, National Research Council, Sesto Fiorentino, Italy 2) National Institute of Optics, National Research Council, Pisa, Italy 3) Physics Department, University of Modena and Reggio Emilia, and Centro S3, CNR Istituto di Nanoscienze, Modena, Italy 4) Department of Physics and Astronomy and LaserLaB Amsterdam, VU University, Amsterdam, The Netherlands (literal)

Titolo

Fiber-top atomic force microscope probe with optical near-field detection capabilities (literal)

Abstract

We present a fibre-top probe fabricated by carving a tipped cantilever on an optical fibre, with the tip machined in correspondence of the fibre core. When approached to an optical prism illuminated under total internal reflection conditions, the tip of the cantilever detects the optical tunnelling signal, while the light coupled from the opposite end of the fibre measures the deflection of the cantilever. Our results suggest that fibre-top technology can be used for the development of a new generation of hybrid probes that can combine atomic force microscopy with scanning near field optical microscopy. (literal)

Editore