Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films (Articolo in rivista)

Type
Label
  • Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1007/s00339-008-4715-8 (literal)
Alternative label
  • C. Scilletta (1); S. Orlando (2); M. Servidori (3); E. Cappelli (1); G. Conte (4); P. Ascarelli (1) (2008)
    Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films
    in Applied physics. A, Materials science & processing (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • C. Scilletta (1); S. Orlando (2); M. Servidori (3); E. Cappelli (1); G. Conte (4); P. Ascarelli (1) (literal)
Pagina inizio
  • 783 (literal)
Pagina fine
  • 787 (literal)
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  • http://www.springerlink.com/content/x7554615503483u8/ (literal)
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  • 93 (literal)
Rivista
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  • Springer. (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 3 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • (1) CNR-ISC, Monterotondo, Roma (2) CNR-IMIP, Potenza (3) CNR-IMM, Bologna (4) Dept. Electronic Engineering and CNISM Univ. Roma Tre (literal)
Titolo
  • Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films (literal)
Abstract
  • Thin carbon films have been deposited in vacuum (?10-4 Pa) on Si substrates by pulsed laser ablation of a graphite target using a Nd:YAG laser operating in the near infrared region (?=1064 nm). The samples have been deposited at different substrate temperatures (T sub) ranging from room temperature (RT) to 800°C. X-ray diffraction analysis established the progressive formation of nanosized graphene structures as T sub increased. In fact, film structure evolves from almost amorphous to nanostructured phase characterized by graphene layers oriented perpendicularly to the film plane. The film density, evaluated by X-ray reflectivity measurements, is strongly affected by T sub. At RT the film density is similar to the graphite one, while it decreases at higher T sub. The electrical properties of the samples have been characterized by field emission measurements. The parameters describing the emitter properties (threshold field E th and field enhancement factor ?) have been evaluated using variable anode-to-cathode distance method. Samples deposited at low T sub have shown the best emission properties, presenting lower E th and larger ? values than those deposited at higher T sub. This is mainly attributed to the sensible density variation, which is in competition with the slighter augment of mean nanoparticle size. (literal)
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