http://www.cnr.it/ontology/cnr/individuo/prodotto/ID57352
Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films (Articolo in rivista)
- Type
- Label
- Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films (Articolo in rivista) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1007/s00339-008-4715-8 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- C. Scilletta (1); S. Orlando (2); M. Servidori (3); E. Cappelli (1); G. Conte (4); P. Ascarelli (1) (literal)
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- Pagina fine
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- http://www.springerlink.com/content/x7554615503483u8/ (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- (1) CNR-ISC, Monterotondo, Roma
(2) CNR-IMIP, Potenza
(3) CNR-IMM, Bologna
(4) Dept. Electronic Engineering and CNISM Univ. Roma Tre (literal)
- Titolo
- Role of growth temperature on nanostructure and field emission properties of PLD thin carbon films (literal)
- Abstract
- Thin carbon films have been deposited in vacuum (?10-4 Pa) on Si substrates by pulsed laser ablation of a graphite target using a Nd:YAG laser operating in the near infrared region (?=1064 nm). The samples have been deposited at different substrate temperatures (T sub) ranging from room temperature (RT) to 800°C. X-ray diffraction analysis established the progressive formation of nanosized graphene structures as T sub increased. In fact, film structure evolves from almost amorphous to nanostructured phase characterized by graphene layers oriented perpendicularly to the film plane. The film density, evaluated by X-ray reflectivity measurements, is strongly affected by T sub. At RT the film density is similar to the graphite one, while it decreases at higher T sub. The electrical properties of the samples have been characterized by field emission measurements. The parameters describing the emitter properties (threshold field E th and field enhancement factor ?) have been evaluated using variable anode-to-cathode distance method. Samples deposited at low T sub have shown the best emission properties, presenting lower E th and larger ? values than those deposited at higher T sub. This is mainly attributed to the sensible density variation, which is in competition with the slighter augment of mean nanoparticle size. (literal)
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