Critical temperature enhancement by biaxial compressive strain in FeSe0.5Te0.5 thin films (Articolo in rivista)

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  • Critical temperature enhancement by biaxial compressive strain in FeSe0.5Te0.5 thin films (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1007/s10948-010-0896-4 (literal)
Alternative label
  • E. Bellingeri 1; I. Pallecchi 1; R. Buzio 1; A. Gerbi 1; D. Marrè 1; M.R. Cimberle 2; M. Tropeano 2; M. Putti 2; A. Palenzona 3; S. Kaciulis 4; C. Ferdeghini 1 (2011)
    Critical temperature enhancement by biaxial compressive strain in FeSe0.5Te0.5 thin films
    in Journal of superconductivity and novel magnetism; Springer, New York (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • E. Bellingeri 1; I. Pallecchi 1; R. Buzio 1; A. Gerbi 1; D. Marrè 1; M.R. Cimberle 2; M. Tropeano 2; M. Putti 2; A. Palenzona 3; S. Kaciulis 4; C. Ferdeghini 1 (literal)
Pagina inizio
  • 35 (literal)
Pagina fine
  • 41 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • ID_PUMA: cnr.imem/2011-A0-008 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 24 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1-2 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] CNR SPIN, I-16152 Genoa, Italy; [ 2 ] CNR IMEM, Dipartimento Fis, I-16146 Genoa, Italy; [ 3 ] Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy; [ 4 ] CNR ISMN, I-00015 Monterotondo Staz, RM, Italy (literal)
Titolo
  • Critical temperature enhancement by biaxial compressive strain in FeSe0.5Te0.5 thin films (literal)
Abstract
  • High-purity epitaxial FeSe(0.5)Te (0.5) thin films with different thicknesses were grown by pulsed laser ablation on different substrates. By varying the film thickness, T (c) values of up to 21 K were observed, significantly larger than the bulk value. Structural analyses indicated that the a axis changes significantly with the film thickness and is linearly related to T (c). The latter result indicates the important role of the compressive strain in enhancing T (c): the compressive strain derives from the Volmer-Weber growth of the films. The critical temperature is also related to both the Fe-(Se,Te) bond length and angle, suggesting the possibility of further enhancement. (literal)
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