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Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces (Articolo in rivista)

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Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces (Articolo in rivista) (literal)

Anno

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Alternative label

Calo A (1), Stoliar P (1), Bystrenova E (1), Valle F (1) and Biscarini F (1) (2009)
Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces
in The journal of physical chemistry. B
(literal)

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Calo A (1), Stoliar P (1), Bystrenova E (1), Valle F (1) and Biscarini F (1) (literal)

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(1) Consiglio Nazionale delle Ricerche - Istituto per lo Studio dei Materiali Nanostrutturati - Bologna (literal)

Titolo

Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces (literal)

Abstract

The morphology of circular DNA deposited from a solution on the mica surface is analyzed from the power spectrum density (PSD) of the atomic force microscopy (AFM) images. Sample morphology is modulated in a broad range of concentration C from isolated molecules to highly entangled networks. DNA exhibits a multiaffine behavior with two correlation length scales: the persistence length P which remains constant (?50 nm) within the C range and the intermolecular distance ? which exhibits a decay with increasing C. Applying a diffusion based model in which ? scales as ? ? D-0.25·C-0.5, we extracted the DNA diffusion coefficient D ? 2 × 10-7 cm2/s. This value is consistent with a high-molecular-weight plasmid DNA supercoiled in the solution. (literal)

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