Degradation of organic light-emitting diodes under different enviroment at high drive conditions (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Degradation of organic light-emitting diodes under different enviroment at high drive conditions (Articolo in rivista) (literal)

Anno

• 2007-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/j.orgel.2006.10.005 (literal)

Alternative label

• S. Gardonio, L. Gregoratti, T. Melpignano, L. Aballe, V. Biondo, R. Zamboni, M. Murgia, S. Caria, M. Kiskinova (2007)
  Degradation of organic light-emitting diodes under different enviroment at high drive conditions
  in Organic electronics (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• S. Gardonio, L. Gregoratti, T. Melpignano, L. Aballe, V. Biondo, R. Zamboni, M. Murgia, S. Caria, M. Kiskinova (literal)

Pagina inizio

• 37 (literal)

Pagina fine

• 43 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 8 (literal)

Rivista

• Organic electronics (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• a Sincrotrone Trieste, Area Science Park, 34012 Trieste, Italy b Centro Ricerche Plast-Optica, via Jacopo Linussio 1, 33020 Amaro (UD), Italy c Istituto per lo Studio dei Materiali Nanostrutturati de ´l CNR, via P. Gobetti 101, 40129 Bologna, Italy (literal)

Titolo

• Degradation of organic light-emitting diodes under different enviroment at high drive conditions (literal)

Abstract

• The origin of dark spots, crucial for understanding the degradation mechanisms in organic light-emitting diodes OLEDs), is typically attributed to the penetration of moisture, oxygen and other active atmospheric agents. Employing scanning X-ray photoelectron spectromicroscopy we have investigated the morphology and chemical composition of degraded micro-areas created in OLEDs under different environment. The same confined degradation events, involving decomposition of the ITO film and organic layer and oxidation and delamination of the Al cathode were observed even for devices grown in situ and operated in ultra-high vacuum at pressures lower than 10 ?9 mbar. Our results provide unambiguously prove that 'uncontrollable' imperfections in the fabricated structures are the major cause for ignition of degradation events, whereas external causes related to the air ambient act as efficient promoters. (literal)

Prodotto di

• dispositivi multifunzionali avanzati basati su nanostrutture organiche e ibride e loro investigazione mediante sonde ottiche non convenzionali (DIMO) (PM.P04.007.001) (Modulo)
• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)

Autore CNR

• ROBERTO ZAMBONI (Persona)
• MAURO MURGIA (Persona)

Incoming links:

Autore CNR di

• ROBERTO ZAMBONI (Persona)
• MAURO MURGIA (Persona)

Prodotto

• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)
• dispositivi multifunzionali avanzati basati su nanostrutture organiche e ibride e loro investigazione mediante sonde ottiche non convenzionali (DIMO) (PM.P04.007.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Organic electronics (Rivista)