Discriminating bulk, surface and interface aging effects in polymer-based active materials for efficient photovoltaic devices (Articolo in rivista)

Type
Label
  • Discriminating bulk, surface and interface aging effects in polymer-based active materials for efficient photovoltaic devices (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.cplett.2010.05.076 (literal)
Alternative label
  • Paci B. (a); Generosi A. (a); Bailo D. (a,b); Rossi Albertini V. (a); R. de Bettignies (c) (2010)
    Discriminating bulk, surface and interface aging effects in polymer-based active materials for efficient photovoltaic devices
    in Chemical physics letters (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Paci B. (a); Generosi A. (a); Bailo D. (a,b); Rossi Albertini V. (a); R. de Bettignies (c) (literal)
Pagina inizio
  • 69 (literal)
Pagina fine
  • 74 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 494 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • http://dx.doi.org/10.1016/j.cplett.2010.05.076 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • (a) ISM-CNR-Area di Ricerca di Tor Vergata, Via del Fosso del Cavaliere 100, 00133 Roma, Italy; (b) Dip.to di Chimica, Università ‘La Sapienza’, P.le A. Moro 5, 00185 Roma, Italy; (c) Composants Solaires CEA INES-RDI, SaVoie Technolac, BP 332, 50 avenue du lac Léman, 73377 LE BOURGET DU LAC, France (literal)
Titolo
  • Discriminating bulk, surface and interface aging effects in polymer-based active materials for efficient photovoltaic devices (literal)
Abstract
  • The present study, reporting time-resolved investigations of polymer-based films for plastic photovoltaics, particularly focuses on aging related to the devices interface properties. The unconventional approach used is based on an in situ cross-monitoring of the films structural/morphological properties. For this propose, Energy Dispersive X-ray Reflectivity and Diffraction techniques were used in synergy with atomic force microscopy analysis. In this way, the meso-scale modifications of the organic film bulk, surface and buried interface with the electrode, were observed directly. As a result of such non-destructive characterization, access to the concomitant chemical–physical processes, occurring to the cell active component during illumination and related to degradation and reliability issues, is gained. (literal)
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