Simultaneous in situ AFM/EDXR techniques for thin films time-resolved morphological studies (Articolo in rivista)

Type
Label
  • Simultaneous in situ AFM/EDXR techniques for thin films time-resolved morphological studies (Articolo in rivista) (literal)
Anno
  • 2009-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.cplett.2009.10.046 (literal)
Alternative label
  • Paci B. (a); Generosi A. (a); Generosi R. (a); Bailo D. (a,b); V. Rossi Albertini V. (a) (2009)
    Simultaneous in situ AFM/EDXR techniques for thin films time-resolved morphological studies
    in Chemical physics letters (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Paci B. (a); Generosi A. (a); Generosi R. (a); Bailo D. (a,b); V. Rossi Albertini V. (a) (literal)
Pagina inizio
  • 159 (literal)
Pagina fine
  • 163 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 483 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • http://dx.doi.org/10.1016/j.cplett.2009.10.046 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • (a) Istituto di Struttura della Materia-C.N.R.; (b) Dip.to di Chimica, Università 'La Sapienza', Roma, Italy (literal)
Titolo
  • Simultaneous in situ AFM/EDXR techniques for thin films time-resolved morphological studies (literal)
Abstract
  • The innovative potential of a non-commercial apparatus for simultaneous in situ Atomic Force Microscopy (AFM) and Energy Dispersive X-ray Reflectometry (EDXR) measurements is presented. A comparison between the two techniques, probing the samples surface in the direct and the reciprocal spaces, respectively, provides a deeper inspection in the surface morphology. Additionally, X-ray Reflectometry applied to films gives joint information on the surface and bulk morphology. The results on a gas sensing film demonstrate how simultaneous time-resolved AFM/EDXR allow the film surface/bulk morphology to be monitored, offering a unique tool to study the active materials in film-based technological devices in operating conditions. (literal)
Prodotto di
Autore CNR

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