Resonant magnetic scattering of polarized x-rays at the Mn 2p edge from Mn0.06Ge0.94 diluted magnetic semiconductor (Articolo in rivista)

Type
Label
  • Resonant magnetic scattering of polarized x-rays at the Mn 2p edge from Mn0.06Ge0.94 diluted magnetic semiconductor (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.tsf.2008.08.050 (literal)
Alternative label
  • De Padova P. 1; Perfetti P. 1; Quaresima C. 1; Zema N. 1; Grazioli C. 1; Spezzani C. 1; Testa A.M. 2; Fiorani D. 2; Olivieri B. 3; Mariot J.M. 4; Taleb-Ibrahimi A. 5; Richter M. C. 6; Heckmann O. 6; Hricovini K. 6 (2008)
    Resonant magnetic scattering of polarized x-rays at the Mn 2p edge from Mn0.06Ge0.94 diluted magnetic semiconductor
    in Thin solid films (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • De Padova P. 1; Perfetti P. 1; Quaresima C. 1; Zema N. 1; Grazioli C. 1; Spezzani C. 1; Testa A.M. 2; Fiorani D. 2; Olivieri B. 3; Mariot J.M. 4; Taleb-Ibrahimi A. 5; Richter M. C. 6; Heckmann O. 6; Hricovini K. 6 (literal)
Pagina inizio
  • 428 (literal)
Pagina fine
  • 429 (literal)
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  • 517 (literal)
Rivista
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  • http://dx.doi.org/10.1016/j.tsf.2008.08.050 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 CNR ISM, Via Fosso del Cavaliere 100, 00133 Roma, Italy 2 CNR ISM, Area Ricerca Roma I Montelibretti, CP 00016 Monterotondo, Italy 3 CNR ISAC, Via Fosso del Cavaliere 100, 00133 Roma, Italy 4 LCP-MR (UMR 7614), Université Pierre et Marie Curie, 11 rue P. et M. Curie, 75231 Paris Cedex 05, France 5 Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, B.P. 48, 91192 Gif-sur-Yvette, France 6 LPMS, Université de Cergy-Pontoise, Neuville-sur-Oise, 95031 Cergy-Pontoise, France (literal)
Titolo
  • Resonant magnetic scattering of polarized x-rays at the Mn 2p edge from Mn0.06Ge0.94 diluted magnetic semiconductor (literal)
Abstract
  • We present expressions for the resonant magnetic X-ray scattering (XRMS) by surfaces possessing roughness and analyze both the structural and magnetic roughness of a surface, as well as their correlation. We demonstrate that the leading contribution to the difference (DI) in the diffuse scattering between left- and right-circularly polarized light for a rough surface vanishes unless the structural and magnetic roughnesses are correlated, to leading order in the magnetization. The effects of magnetic domain structure and magnetic dead layers on the surface scattering are also discussed. (literal)
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