http://www.cnr.it/ontology/cnr/individuo/prodotto/ID51940
Resolution of an emission electron microscope in the presence of magnetic fields on the object (Articolo in rivista)
- Type
- Label
- Resolution of an emission electron microscope in the presence of magnetic fields on the object (Articolo in rivista) (literal)
- Anno
- 2002-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1002/1521-3889(200206)11:6<461::AID-ANDP461>3.0.CO;2-6 (literal)
- Alternative label
Nepijko S. A., Sedov N. N., Schonhense G., Muschiol U., Schneider C. M., Zennaro S., Zema N. (2002)
Resolution of an emission electron microscope in the presence of magnetic fields on the object
in Annalen der Physik (Weinheim. Internet); WILEY-V C H VERLAG GMBH, WEINHEIM (Germania)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Nepijko S. A., Sedov N. N., Schonhense G., Muschiol U., Schneider C. M., Zennaro S., Zema N. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Univ Mainz, Inst Phys, D-55099 Mainz, Germany
Natl Acad Sci Ukraine, Inst Phys, UA-03650 Kiev, Ukraine
Moscow Mil Inst, Moscow 109380, Russia
Inst Solid State & Mat Res, D-01069 Dresden, Germany
CNR, Ist Struttura Mat, I-00133 Rome, Italy (literal)
- Titolo
- Resolution of an emission electron microscope in the presence of magnetic fields on the object (literal)
- Abstract
- The known Brüche-Recknagel formula for determining the resolving power of
an emission electron microscope (EEM) was derived assuming idealized
conditions: the object surface was planar, and the accelerating electric
field was homogeneous. However, deviations from these conditions will
deteriorate the resolving power. This can be caused by a surface topography
as well as local electric or magnetic fields on the object surface. In the
present paper the resolving power of an EEM is calculated for the case when
there are local magnetic fields on the object surface. The deterioration of
the resolving power will then depend on the local field strength not only
in the given point of the object surface, but also in adjacent regions. The
estimations performed show that the lateral resolution in EEM under the
influence of magnetic microfields of real ferromagnets can be several times
worse than in the case of the absence of these fields. (literal)
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