Resolution of an emission electron microscope in the presence of magnetic fields on the object (Articolo in rivista)

Type
Label
  • Resolution of an emission electron microscope in the presence of magnetic fields on the object (Articolo in rivista) (literal)
Anno
  • 2002-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1002/1521-3889(200206)11:6<461::AID-ANDP461>3.0.CO;2-6 (literal)
Alternative label
  • Nepijko S. A., Sedov N. N., Schonhense G., Muschiol U., Schneider C. M., Zennaro S., Zema N. (2002)
    Resolution of an emission electron microscope in the presence of magnetic fields on the object
    in Annalen der Physik (Weinheim. Internet); WILEY-V C H VERLAG GMBH, WEINHEIM (Germania)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Nepijko S. A., Sedov N. N., Schonhense G., Muschiol U., Schneider C. M., Zennaro S., Zema N. (literal)
Pagina inizio
  • 461 (literal)
Pagina fine
  • 472 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 11 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Univ Mainz, Inst Phys, D-55099 Mainz, Germany Natl Acad Sci Ukraine, Inst Phys, UA-03650 Kiev, Ukraine Moscow Mil Inst, Moscow 109380, Russia Inst Solid State & Mat Res, D-01069 Dresden, Germany CNR, Ist Struttura Mat, I-00133 Rome, Italy (literal)
Titolo
  • Resolution of an emission electron microscope in the presence of magnetic fields on the object (literal)
Abstract
  • The known Brüche-Recknagel formula for determining the resolving power of an emission electron microscope (EEM) was derived assuming idealized conditions: the object surface was planar, and the accelerating electric field was homogeneous. However, deviations from these conditions will deteriorate the resolving power. This can be caused by a surface topography as well as local electric or magnetic fields on the object surface. In the present paper the resolving power of an EEM is calculated for the case when there are local magnetic fields on the object surface. The deterioration of the resolving power will then depend on the local field strength not only in the given point of the object surface, but also in adjacent regions. The estimations performed show that the lateral resolution in EEM under the influence of magnetic microfields of real ferromagnets can be several times worse than in the case of the absence of these fields. (literal)
Editore
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Editore di
Insieme di parole chiave di
data.CNR.it