Quantitative texture analysis from powder-like electron diffraction data (Articolo in rivista)

Type
Label
  • Quantitative texture analysis from powder-like electron diffraction data (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1107/S0021889811012106 (literal)
Alternative label
  • Gemmi, M.; Voltolini, M.; Ferretti, A. M.; Ponti, A. (2011)
    Quantitative texture analysis from powder-like electron diffraction data
    in Journal of applied crystallography
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Gemmi, M.; Voltolini, M.; Ferretti, A. M.; Ponti, A. (literal)
Pagina inizio
  • 454 (literal)
Pagina fine
  • 461 (literal)
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  • 44 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • DOI: 10.1107/S0021889811012106 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • aIIT@NEST, Piazza S. Silvestro 12, 56127 Pisa, Italy, bDipartimento di Scienze della Terra 'A. Desio', Universita` degli Studi di Milano, Via Botticelli 23, 20133 Milano, Italy, cDipartimento di Geoscienze, Universita' di Padova, Via Giotto 1, 35137 Padova, Italy, and dLaboratorio di Nanotecnologie, Istituto di Scienze e Tecnologie Molecolari, Consiglio Nazionale delle Ricerche, Via G. Fantoli 16/15, 20138 Milano, Italy. Correspondence e-mail: mauro.gemmi@iit.it (literal)
Titolo
  • Quantitative texture analysis from powder-like electron diffraction data (literal)
Abstract
  • The textures of an Al thin film and of a-MnS nanocrystals deposited on a carbon film grid have been analysed using powder electron diffraction. For each sample a series of powder electron diffraction patterns tilted with respect to two orthogonal axes were collected, to adapt to this type of data the texture analysis procedures commonly used in synchrotron X-ray transmission geometry. Both pattern sets have been analysed with the Rietveld procedure embedded in the software MAUD. The fit is satisfactory with agreement factors of 7.03% for the Al film and 3.42% for a-MnS and reveals in both cases a (111) preferred orientation with a pronounced cylindrical symmetry. The (111) and (100) pole figures, plotted in terms of multiples of random distribution (m.r.d.), show a fairly strong lattice preferred orientation in the Al thin film and a stronger one in the deposited a-MnS nanocrystals, with maxima, for the (111) pole figures, of 8.8 and 19.7 m.r.d., respectively. (literal)
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