http://www.cnr.it/ontology/cnr/individuo/prodotto/ID47721
Metal oxoclusters as molecular building blocks for the development of nanostructured inorganic-organic hybrid thin films (Articolo in rivista)
- Type
- Label
- Metal oxoclusters as molecular building blocks for the development of nanostructured inorganic-organic hybrid thin films (Articolo in rivista) (literal)
- Anno
- 2006-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1007/s00706-006-0444-x (literal)
- Alternative label
Gross S., Zattin A., Di Noto V., Lavina S. (2006)
Metal oxoclusters as molecular building blocks for the development of nanostructured inorganic-organic hybrid thin films
in Monatshefte für Chemie
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Gross S., Zattin A., Di Noto V., Lavina S. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Univ Padua, Dept Chem, CNR, ISTM, I-35131 Padua, Italy
Univ Padua, Dept Chem, Padua, Italy (literal)
- Titolo
- Metal oxoclusters as molecular building blocks for the development of nanostructured inorganic-organic hybrid thin films (literal)
- Abstract
- Silica-based inorganic-organic hybrid thin films embedding the organically modified oxohafnium clusters (Hf4O2(OMc)(12), OMc=OC(O)-C(CH3)=CH2) were obtained by photo-activated free radical copolymerisation of the methacrylate groups of the cluster with those of the pre-hydrolysed (methacryloxypropyl)trimethoxysilane (MAPTMS, (CH2=C(CH3)C(O)O)(CH2)(3)Si(OCH3)(3)). By this route, a covalent anchoring of the cluster to the forming silica network was achieved. Samples characterized by two different Si/Hf compositions (18:1, 5:1) were prepared. The surface and in-depth composition of the thin films were investigated through Fourier transform infrared spectroscopy (FT-IR) and X-ray photoelectron spectroscopy (XPS). XPS depth profiles performed on the thin layers evidenced a homogenous in depth distribution of the hafnium guest species within the whole silica films and sharp film-substrate interfaces. (literal)
- Prodotto di
- Autore CNR
- Insieme di parole chiave
Incoming links:
- Prodotto
- Autore CNR di
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
- Insieme di parole chiave di