http://www.cnr.it/ontology/cnr/individuo/prodotto/ID47635
Zirconium and hafnium oxoclusters as molecular building blocks for highly dispersed ZrO2 or HfO2 nanoparticles in silica thin films (Articolo in rivista)
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- Label
- Zirconium and hafnium oxoclusters as molecular building blocks for highly dispersed ZrO2 or HfO2 nanoparticles in silica thin films (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1039/b500521c (literal)
- Alternative label
Armelao L.; Eisenmenger-Sittner C.; Groenewolt M.; Gross S.; Sada C.; Schubert U.; Tondello E.; Zattin A. (2005)
Zirconium and hafnium oxoclusters as molecular building blocks for highly dispersed ZrO2 or HfO2 nanoparticles in silica thin films
in Journal of materials chemistry (Print); Royal Society of Chemistry, Cambridge (Regno Unito)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Armelao L.; Eisenmenger-Sittner C.; Groenewolt M.; Gross S.; Sada C.; Schubert U.; Tondello E.; Zattin A. (literal)
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- Study performed in the framework of cooperation with different (3) international groups.
First thorough study on crystallisation behaviour and evolution of binary zirconia-silica oxide. The manuscript represents a remarkable advance in the field of materials research, and in particular in the development of oxide-based thin films since it presents a new approach to the preparation of thin films characterized by a uniform dispersion of the different components. In fact, the devised method enables to achieve a homogeneous distribution of the host nanoparticles in the silica host matrix. Furthermore, since the cluster are grafted to a partially formed silica network, the nucleation of the host nanoparticles is spatially confined, and the growth of larger particles is avoided. This approach represents a general route to the preparation of homogeneous multicomponent oxide based-materials. Furthermore, a multitechnique approach for the thorough characterization of the films is here presented, which is based on the use of different analytical tools delivering complementary information on the composition, microstructure and morphology of the nanostructured layers. (literal)
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- ISI Web of Science (WOS) (literal)
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- Lidia Armelao,a Christoph Eisenmenger-Sittner,b Matthijs Groenewolt,c
Silvia Gross,a Cinzia Sada,d Ulrich Schubert,e Eugenio Tondelloa and
Andrea Zattina
aCNR-ISTM and INSTM, Department of Chemical Sciences,
University of Padova, via Marzolo, 1- I-35131, Padova, Italy.
E-mail: silvia.gross@unipd.it; Fax: ++39-049-8275161;
Tel: ++39-049-8275736
bInstitut fu¨r Festko¨rperphysik-Vienna University of Technology, Vienna,
Austria
cMax-Planck-Institut fu¨r Kolloid- und Grenzfla¨chenforschung, Golm,
Germany
dDepartment of Physics, University of Padova, Padova, Italy
eInstitute of Materials Chemistry-Vienna University of Technology,
Vienna, Austria (literal)
- Titolo
- Zirconium and hafnium oxoclusters as molecular building blocks for highly dispersed ZrO2 or HfO2 nanoparticles in silica thin films (literal)
- Abstract
- A novel synthetic route for the preparation of ZrO2 or HfO2 nanoparticles homogeneously
dispersed in SiO2 thin films was developed. This route is based on the copolymerisation of
organically modified crystalline oxozirconium or oxohafnium clusters (M4O2(OMc)12, M 5 Zr,
Hf; OMc 5 OC(O)-C(CH3)LCH2) with (methacryloxymethyl)triethoxysilane (MAMTES,
CH2LC(CH3)C(O)O-CH2Si(OCH2CH3)3). These crystalline clusters, which are the precursors for
the corresponding metal oxides (MO2), were prepared via the sol-gel route by reaction of
zirconium or hafnium butoxide (M(OBu)4) with methacrylic acid. The copolymerisation of the
clusters with the methacrylate-functionalised siloxane was photoinitaited by Irgacure 184 and
allowed the anchoring of the cluster to the forming silica network. The solution was cast into films
by dip-coating and UV cured (10 min, 125 W) to promote the copolymerisation of the
methacrylate groups of the cluster with those of the silane. Transparent and homogeneous films
200-450 nm thick were obtained after calcination at 800 uC in air. This route allowed the
production of a very homogeneous dispersion of the MO2 precursors inside the silica matrix. The
surface and in-depth composition of the thin films was investigated through IR, X-ray
photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). SIMS and XPS
depth profiles evidenced a very homogenous distribution of both zirconium or hafnium
throughout the silica films and sharp film-substrate interfaces. The surface morphology of the
coatings was investigated through atomic force microscopy (AFM), which showed smooth,
homogeneous and crack-free surfaces. Through X-ray diffraction (XRD) the crystallisation of
hafnium and zirconium oxides was revealed, while the presence of isolated crystalline
nanoparticles having a diameter of 5-10 nm was evidenced by transmission electron microscopy
(TEM). A pull-off test indicated a very good adhesion of the films to the substrate. (literal)
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