http://www.cnr.it/ontology/cnr/individuo/prodotto/ID47633
Ion-, photo-electron- and laser -assisted analytical investigation of nano-structured mixed HfO2-SiO2 and ZrO2-SiO2 thin films (Articolo in rivista)
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- Label
- Ion-, photo-electron- and laser -assisted analytical investigation of nano-structured mixed HfO2-SiO2 and ZrO2-SiO2 thin films (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.apsusc.2004.12.008 (literal)
- Alternative label
Armelao L., Bleiner D., Di Noto V., Gross S., Sada C., Schubert U., Tondello A., Vonmont H., Zattin A. (2005)
Ion-, photo-electron- and laser -assisted analytical investigation of nano-structured mixed HfO2-SiO2 and ZrO2-SiO2 thin films
in Applied surface science
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Armelao L., Bleiner D., Di Noto V., Gross S., Sada C., Schubert U., Tondello A., Vonmont H., Zattin A. (literal)
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- Pagina fine
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Univ Padua, Dipartimento Sci Chim, INSTM, CNR ISTM, I-35131 Padua, Italy
Swiss Fed Lab Mat Res, EMPA, CH-8600 Dubendorf, Switzerland
Univ Padua, Dipartimento Fis, I-35131 Padua, Italy
Vienna Tech Univ, Inst Mat Chem, A-1040 Vienna, Austria (literal)
- Titolo
- Ion-, photo-electron- and laser -assisted analytical investigation of nano-structured mixed HfO2-SiO2 and ZrO2-SiO2 thin films (literal)
- Abstract
- In this study, the surface and depthwise composition of hafnium- and zirconium-based inorganic-organic hybrid layers, as well as of binary HfO2-SiO2 and ZrO2-SiO2 thin films, obtained by calcination at high temperature (T = 800 degrees C) of the hybrid films, were analysed by using different analytical methods which can deliver complementary information on chemical composition and both in-depth and lateral distribution of the species. In particular, X-ray photoelectron spectroscopy (XPS) was used to investigate the chemical composition of the thin films (quantitative analysis, oxidation states, nature of the interaction between host matrix and guest species) on the surface as well along the film thickness. The depthwise distribution of the involved species was thoroughly investigated by means of secondary ion mass spectrometry (SIMS). Information concerning the lateral distribution of the species was gained also by laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). (literal)
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