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Thickness dependence of pinning mechanisms in granular Nb thin films (Articolo in rivista)
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- Thickness dependence of pinning mechanisms in granular Nb thin films (Articolo in rivista) (literal)
- Anno
- 2006-01-01T00:00:00+01:00 (literal)
- Alternative label
Prischepa, SL; Montemurro, D; Cirillo, C; Attanasio, C; Salvato, M; Merlo, V; Lykov, AN; Tsvetkov, AY (2006)
Thickness dependence of pinning mechanisms in granular Nb thin films
in Superconductor science and technology (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Prischepa, SL; Montemurro, D; Cirillo, C; Attanasio, C; Salvato, M; Merlo, V; Lykov, AN; Tsvetkov, AY (literal)
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- ISI Web of Science (WOS) (literal)
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- Univ Salerno, CNR, INFM, Lab Reg SuperMat, I-84081 Baronissi, Sa, Italy; Univ Salerno, Dipartimento Fis ER Caianiello, I-84081 Baronissi, Sa, Italy; Belarus State Univ Informat & Radioelect, Minsk 220013, Byelarus; Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy; RAS, PN Lebedev Phys Inst, Lab Superconduct, Moscow 119991, Russia (literal)
- Titolo
- Thickness dependence of pinning mechanisms in granular Nb thin films (literal)
- Abstract
- We have investigated the influence of thickness on the pinning properties of granular sputtered Nb films in a parallel magnetic field. The presence of a crossover in the pinning mechanisms at some critical thickness d(c) was established. Below d(c) the pinning is due to individual vortices. Above dc the commensurability between the vortex period and the film thickness occurs, causing a large increase in the critical current density due to surface pinning. It is shown that, in the vortex-free limit, when the critical current is determined by the depairing current, the effect of the commensurability is not present. (literal)
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