Analysis of residual stresses in ternary electroconductive composites (Articolo in rivista)

Type
Label
  • Analysis of residual stresses in ternary electroconductive composites (Articolo in rivista) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1007/s00339-005-3314-1 (literal)
Alternative label
  • Diletta Sciti; Stefano Guicciardi; Giancarlo Celotti; Shigemi Tochino; Giuseppe Pezzotti (2006)
    Analysis of residual stresses in ternary electroconductive composites
    in Applied physics. A, Materials science & processing (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Diletta Sciti; Stefano Guicciardi; Giancarlo Celotti; Shigemi Tochino; Giuseppe Pezzotti (literal)
Pagina inizio
  • 317 (literal)
Pagina fine
  • 324 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.springerlink.com/content/u47ulpm7610k1051/fulltext.pdf (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 82 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 2 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Diletta Sciti, Stefano Guicciardi, Giancarlo Celotti: CNR-ISTEC, Institute of Science and Technology for Ceramics, Via Granarolo 64, 48018 Faenza, Italy. Shigemi Tochino, Giuseppe Pezzotti: Department of Materials, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, 606-8585 Kyoto, Japan. Diletta Sciti, Stefano Guicciardi, Giancarlo Celotti, Shigemi Tochino, Giuseppe Pezzotti: Research Institute for Nanoscience, RIN, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, 606-8585 Kyoto, Japan. (literal)
Titolo
  • Analysis of residual stresses in ternary electroconductive composites (literal)
Abstract
  • Residual stresses in ceramic particle electroconductive composites were investigated by Raman microprobe spectroscopy and X-ray diffraction. The composites were ternary electroconductive ceramics in the system AlN+SiC+(ZrB2, MoSi2). Due to the poor definition of the reinforcing phase peaks, only the matrix residual stress could be evaluated by Raman spectroscopy, whilst the residual stress in the reinforcing phase was calculated by the equilibrium conditions. These calculated values were compared with those experimentally obtained by X-ray diffraction. The agreement between Raman and X-ray results was quite satisfactory. The values of residual stress calculated by the composite theory were in good agreement with those measured by Raman and X-ray diffraction for the MoSi2-containing composite. For the ZrB2-containing composite, the value calculated by the composite theory falls between the values measured by Raman and X-ray diffraction (literal)
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