Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy (Articolo in rivista) (literal)

Anno

• 2008-01-01T00:00:00+01:00 (literal)

Alternative label

• Gucciardi, PG; Lopes, M; Deturche, R; Julien, C; Barchiesi, D; de la Chapelle, ML (2008)
  Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy
  in Nanotechnology (Bristol. Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Gucciardi, PG; Lopes, M; Deturche, R; Julien, C; Barchiesi, D; de la Chapelle, ML (literal)

Pagina inizio

• 215702 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 19 (literal)

Rivista

• Nanotechnology (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Ist Proc Chim Fis, CNR, Sez Messina, I-98158 Messina, Italy Univ Technol Troyes, Lab Nanotechnol & Instrument Opt, CNRS, Inst Charles Delaunay,FRE 2848, F-10010 Troyes, France (literal)

Titolo

• Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy (literal)

Abstract

• We have investigated the depolarization effects of light scattered by sharp tips used for apertureless near-field optical microscopy. Dielectric and metal coated tips have been investigated and depolarization factors between 5 and 30% have been measured, changing as a function of the incident light polarization and of the tip shape. The experimental results are in good agreement with theoretical calculations performed by the finite element method, giving a near-field depolarization factor close to 10%. The effect of depolarization has been investigated in polarized tip-enhanced Raman spectroscopy (TERS) experiments; the depolarization gives rise to forbidden Raman modes in Si crystals. (literal)

Prodotto di

• Spettroscopia, Imaging e Intrappolamento di nanosistemi colloidali, supramolecolari e superfici (MD.P01.014.006) (Modulo)
• Istituto per i processi chimico-fisici (IPCF) (Istituto)

Autore CNR

• PIETRO GIUSEPPE GUCCIARDI (Persona)

Insieme di parole chiave

• Parole chiave di "Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto per i processi chimico-fisici (IPCF) (Istituto)
• Spettroscopia, Imaging e Intrappolamento di nanosistemi colloidali, supramolecolari e superfici (MD.P01.014.006) (Modulo)

Autore CNR di

• PIETRO GIUSEPPE GUCCIARDI (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Nanotechnology (Rivista)

Insieme di parole chiave di

• Parole chiave di "Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy" (Insieme di parole chiave)