Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy (Articolo in rivista) (literal)

Anno

• 2008-01-01T00:00:00+01:00 (literal)

Alternative label

• Da Pieve, F; Sebilleau, D; Di Matteo, S; Gunnella, R; Gotter, R; Ruocco, A; Stefani, G; Natoli, CR (2008)
  Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy
  
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Da Pieve, F; Sebilleau, D; Di Matteo, S; Gunnella, R; Gotter, R; Ruocco, A; Stefani, G; Natoli, CR (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 78 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• \"[Da Pieve, F.] Univ Bourgogne, Inst Carnot Bourgogne, CNRS, UMR 5209, F-21078 Dijon, France; [Da Pieve, F.; Ruocco, A.; Stefani, G.] Univ Roma Tre, Dipartimento Fis, I-00146 Rome, Italy; [Da Pieve, F.; Ruocco, A.; Stefani, G.] Univ Roma Tre, CNISM, I-00146 Rome, Italy; [Sebilleau, D.; Di Matteo, S.] Univ Rennes 1, UMR CNRS UR1 6251, Inst Phys Rennes, Equipe Phys Surfaces & Interfaces, F-35042 Rennes, France; [Gunnella, R.] Univ Camerino, Dipartimento Fis, I-62032 Camerino, Italy; [Gotter, R.] CNR, INFM, Lab Nazl TASC, I-34012 Trieste, Italy; [Natoli, C. R.] Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Frascati, Italy (literal)

Titolo

• Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy (literal)

Abstract

• We have developed a generalization of the multiple-scattering formalism to deal with Auger-photoelectron coincidence spectroscopy (APECS) in the solid state. We have merged the exact atomic treatment of the angular correlations between the two electrons and the single-particle approach, on which the multiple-scattering description of condensed matter relies. This allows the recovering, even in extended systems, of the entangled form of the electron-pair wave function characterizing the coincidence angular diffraction pattern. In the atomic limit our formalism correctly reproduces the cross section, as calculated within the statistical-tensors approach, usually employed in atomic physics. We have then performed numerical calculations for the Ge(100) L3M45M45 APECS and compared the results with previous experiments. We found that, in the given geometry, the diffraction patterns in coincidence with different directions of the photoelectron keep little memory of the atomic anisotropy. We speculate on the conditions to be fulfilled in order to enhance the atomic-orbital sensitivity in APECS through solid-state diffraction effects. (literal)

Prodotto di

• Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.001) (Modulo)

Autore CNR

• Alessandro RUOCCO (Unità di personale esterno)
• ROBERTO GUNNELLA (Unità di personale esterno)
• ROBERTO GOTTER (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ROBERTO GOTTER (Unità di personale interno)
• ROBERTO GUNNELLA (Unità di personale esterno)
• Alessandro RUOCCO (Unità di personale esterno)

Prodotto

• Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.001) (Modulo)

Insieme di parole chiave di

• Parole chiave di "Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy" (Insieme di parole chiave)