Different contrast mechanisms induced by topography artifacts in Near-Field Optical Microscopy (Articolo in rivista)

Type
Label
  • Different contrast mechanisms induced by topography artifacts in Near-Field Optical Microscopy (Articolo in rivista) (literal)
Anno
  • 2001-01-01T00:00:00+01:00 (literal)
Alternative label
  • Gucciardi P.G., and Colocci M. (2001)
    Different contrast mechanisms induced by topography artifacts in Near-Field Optical Microscopy
    in Applied physics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Gucciardi P.G., and Colocci M. (literal)
Pagina inizio
  • 1543 (literal)
Pagina fine
  • 1545 (literal)
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  • IMPACT FACTOR = 3,849 (literal)
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  • 79 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR, Ist Tecn Spettroscop, I-98123 Messina, Italy Univ Florence, Dipartimento Fis, INFM, Unita Firenze, I-50125 Florence, Italy LENS, I-50125 Florence, Italy (literal)
Titolo
  • Different contrast mechanisms induced by topography artifacts in Near-Field Optical Microscopy (literal)
Abstract
  • Topography artifacts can affect the elastic scattering optical images in near-field optical microscopy.Moreover, such effects can completely mask the information on the optical properties of the samples, yielding unexpectedly high lateral resolutions. In this letter, we provide experimental evidence of how changes involving the collection geometry and the roughness of the sample can lead to radical modifications of the contrast induced by the artifacts to the optical map. An explanation of the different regimes is provided by means of approach curves in which the optical signal is detected as a function of the probe/sample distance. (literal)
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