Analysis of surface-bulk screening competition in the electron-doped Nd2-xCexCuO4 cuprate using x-ray photoemission spectroscopy (Articolo in rivista)

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  • Analysis of surface-bulk screening competition in the electron-doped Nd2-xCexCuO4 cuprate using x-ray photoemission spectroscopy (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Alternative label
  • Panaccione, G; Offi, F; Torelli, P; Vanko, G; Tjernberg, O; Lacovig, P; Guarino, A; Fondacaro, A; Nigro, A; Sacchi, M; Brookes, NB; Monaco, G (2008)
    Analysis of surface-bulk screening competition in the electron-doped Nd2-xCexCuO4 cuprate using x-ray photoemission spectroscopy
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Panaccione, G; Offi, F; Torelli, P; Vanko, G; Tjernberg, O; Lacovig, P; Guarino, A; Fondacaro, A; Nigro, A; Sacchi, M; Brookes, NB; Monaco, G (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 77 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • \"[Panaccione, G.] INFM, TASC Lab, I-34012 Trieste, Italy; [Offi, F.] Univ Roma Tre, CNISM, Dipartimento Fis, I-00146 Rome, Italy; [Torelli, P.] Ctr Univ Paris Sud, Utilisat Rayonnement Electromagnet Lab, F-91898 Orsay, France; [Vanko, G.; Tjernberg, O.; Fondacaro, A.; Brookes, N. B.; Monaco, G.] European Synchrotron Radiat Facil, F-38042 Grenoble 9, France; [Tjernberg, O.] Royal Inst Technol, LMSP, S-16440 Kista, Sweden; [Lacovig, P.] Sincrotrone Trieste SCPA, I-34012 Trieste, Italy; [Guarino, A.; Nigro, A.] Univ Salerno, INFM, CNR, Lab Reg SuperMat Presso Dip Fis ER Caianiello, I-84081 Baronissi, Italy; [Sacchi, M.] Univ Paris 06, Lab Chim Phys Matiere & Rayonnement, F-75005 Paris, France; [Sacchi, M.] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France (literal)
Titolo
  • Analysis of surface-bulk screening competition in the electron-doped Nd2-xCexCuO4 cuprate using x-ray photoemission spectroscopy (literal)
Abstract
  • We report core level and valence band photoemission results obtained for Nd2-xCexCuO4 (x = 0.15) single crystals and films by using both soft and hard x rays, hence, with tunable depth sensitivity. When using hard x rays only, we observe distinct and energy separated structures in the main 2p(5)3d(9)L peak of Cu 2p(3/2) and 2p(1/2) core levels, including the well screened features located at the high kinetic energy side, which were recently reported by Taguchi et al. [Phys. Rev. Lett. 95, 177002 (2005)]. By varying the photoelectron takeoff angle, we analyze the difference in the screening properties between surface and bulk, and we demonstrate the depth dependence of the electronic properties by following the evolution of the bulk-related peak. The possible influence of the surface conditions on the Cu 2p spectral features is also discussed. (literal)
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