A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry (Articolo in rivista)

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Label
  • A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Alternative label
  • Benzi, F; Davoli, I; Rovezzi, M; d'Acapito, F (2008)
    A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry
    in Review of scientific instruments
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Benzi, F; Davoli, I; Rovezzi, M; d'Acapito, F (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 79 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • \"[Benzi, F.; Davoli, I.] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy; [Rovezzi, M.; d'Acapito, F.] CRG, GILDA, ESRF, CNR INFM OGG, F-38043 Grenoble, France (literal)
Titolo
  • A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry (literal)
Abstract
  • A novel code for the analysis of extended x-ray absorption fine structure (EXAFS) data collected in total reflection mode (reflEXAFS) is presented. The procedure calculates the theoretical fine structure signals appearing in the reflectivity spectrum starting from the ab initio EXAFS calculations. These signals are then used in complex structural refinement (i.e., also including multiple scattering paths) with usual fitting programs of EXAFS data. A test case consisting in the analysis of a gold film collected at different incidence angles is presented in detail. (literal)
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