http://www.cnr.it/ontology/cnr/individuo/prodotto/ID3789
Sample Preparation for the Quick Sizing of Metal Nanoparticles by Atomic Force Microscopy (Articolo in rivista)
- Type
- Label
- Sample Preparation for the Quick Sizing of Metal Nanoparticles by Atomic Force Microscopy (Articolo in rivista) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1002/jemt.20631 (literal)
- Alternative label
Vinelli, A; Primiceri, E; Brucale, M; Zuccheri, G; Rinaldi, R; Samori, B (2008)
Sample Preparation for the Quick Sizing of Metal Nanoparticles by Atomic Force Microscopy
in Microscopy research and technique (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Vinelli, A; Primiceri, E; Brucale, M; Zuccheri, G; Rinaldi, R; Samori, B (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://onlinelibrary.wiley.com/doi/10.1002/jemt.20631/abstract (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- \"[Vinelli, Alessandra; Brucale, Marco; Zuccheri, Giampaolo; Samori, Bruno] Univ Bologna, Dept Biochem G Moruzzi, CNR, Natl Inst Phys Matter,Ctr S3, I-40126 Bologna, Italy; [Primiceri, Elisabetta; Rinaldi, Ross] Univ Salento, Scuola Super ISUFI, CNR, Ist Nazl Fis Mat,Natl Nanotechnol Lab, I-73100 Lecce, Italy; [Zuccheri, Giampaolo] Univ Bologna, Interdepartmental Ctr L Galvani, I-40126 Bologna, Italy; [Samori, Bruno] Univ Bologna, Italian Interuniv Consortium Mat Sci & Technol, I-40126 Bologna, Italy (literal)
- Titolo
- Sample Preparation for the Quick Sizing of Metal Nanoparticles by Atomic Force Microscopy (literal)
- Abstract
- Two alternative pretreatment methods for depositing metal nanoparticles on mica for atomic force microscopy (AFM) imaging are presented. The treated substrates are flat and clean, thus they are amenable of use to characterize very small nanoparticles. The methods do not require any instrumentation or particular expertise. As they are also very quick, the need for storage of the prepared substrates is avoided altogether. These proposed methods, which are compared with the results of transmission electron microscopy analysis, allow the quick sizing and characterization of nanoparticles with the atomic force microscope and could thus help expanding the user community of nanoparticle researchers who could use the AFM for their characterization needs. (literal)
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