A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze (Articolo in rivista) (literal)

Anno

• 2009-01-01T00:00:00+01:00 (literal)

Alternative label

• Simion S, Marcelli R, Sajin G, Bartolucci G, Craciounoiu F (2009)
  A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze
  in Romanian Journal of Information Science and Technology
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Simion S, Marcelli R, Sajin G, Bartolucci G, Craciounoiu F (literal)

Pagina inizio

• 394 (literal)

Pagina fine

• 401 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 12 (literal)

Rivista

• Romanian Journal of Information Science and Technology (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 8 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 3 (literal)

Note

• Scopu (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• a National Institute for Research and Development in Microtechnologies, Bucharest, Romania b Military Technical Academy, Electronics and Communications Dept., Bucharest, Romania c CNR - Institute for Microelectronics and Microsystems, Microwave Microsystems Group, Rome, Italy d University Tor Vergata, Dept. of Electronics Engineering, Rome, Italy (literal)

Titolo

• A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze (literal)

Abstract

• The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (V ector Network A nalyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement. (literal)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsistemi ad Alta Frequenza: Tecnologie ed Affidabilità per Applicazioni di Terra e Spaziali (MD.P05.020.001) (Modulo)

Autore CNR

• GIANCARLO BARTOLUCCI (Unità di personale esterno)
• ROMOLO MARCELLI (Persona)

Insieme di parole chiave

• Keywords of "A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ROMOLO MARCELLI (Persona)
• GIANCARLO BARTOLUCCI (Unità di personale esterno)

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsistemi ad Alta Frequenza: Tecnologie ed Affidabilità per Applicazioni di Terra e Spaziali (MD.P05.020.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Romanian Journal of Information Science and Technology (Rivista)

Insieme di parole chiave di

• Keywords of "A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze" (Insieme di parole chiave)