Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12) thin films (Articolo in rivista)

Type
Label
  • Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12) thin films (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Alternative label
  • Fiorenza P, Lo Nigro R, Raineri V (2011)
    Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12) thin films
    in Nanoscale research letters (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Fiorenza P, Lo Nigro R, Raineri V (literal)
Pagina inizio
  • 118 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 6 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • IMM-CNR (literal)
Titolo
  • Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12) thin films (literal)
Abstract
  • The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12) (CCTO) thin films deposited by MOCVD on IrO(2) bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated. (literal)
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