Structural and electronic characterization of (2,3(3)) bar-shaped stacking fault in 4H-SiC epitaxial layers (Articolo in rivista)

Type
Label
  • Structural and electronic characterization of (2,3(3)) bar-shaped stacking fault in 4H-SiC epitaxial layers (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Alternative label
  • Camarda M, Canino A, La Magna A, La Via F, Feng G, Kimoto T, Aoki M, Kawanowa H (2011)
    Structural and electronic characterization of (2,3(3)) bar-shaped stacking fault in 4H-SiC epitaxial layers
    in Applied physics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Camarda M, Canino A, La Magna A, La Via F, Feng G, Kimoto T, Aoki M, Kawanowa H (literal)
Pagina inizio
  • 051915 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 98 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Titolo
  • Structural and electronic characterization of (2,3(3)) bar-shaped stacking fault in 4H-SiC epitaxial layers (literal)
Prodotto di
Autore CNR

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