Simultaneous nickel silicidation and silicon crystallization induced by excimer laser annealing on plastic substrate (Articolo in rivista)

Type
Label
  • Simultaneous nickel silicidation and silicon crystallization induced by excimer laser annealing on plastic substrate (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.3377916 (literal)
Alternative label
  • Alberti A; La Magna A; Cuscuna M; Fortunato G; Privitera V (2010)
    Simultaneous nickel silicidation and silicon crystallization induced by excimer laser annealing on plastic substrate
    in Applied physics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Alberti A; La Magna A; Cuscuna M; Fortunato G; Privitera V (literal)
Pagina inizio
  • 142113 (literal)
Pagina fine
  • 142113 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://apl.aip.org/resource/1/applab/v96/i14/p142113_s1 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 96 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. CNR IMM, I-95121 Catania, Italy 2. CNR IMM, I-00133 Rome, Italy (literal)
Titolo
  • Simultaneous nickel silicidation and silicon crystallization induced by excimer laser annealing on plastic substrate (literal)
Abstract
  • Ni-Si reaction and alpha-Si crystallization on polyimide were simultaneously induced by excimer laser annealing. A similar to 8 nm Ni film was deposited on Si in such a way that Ni atoms were also distributed within the alpha-Si layer. The role of Ni atoms during crystallization and surface silicidation was studied in the submelting regime and modeled by diffusion-reaction equations. It has been found that the starting Ni distribution in alpha-Si and the thermal gradient due to the plastic were crucial to induce Si crystallization. At a threshold of similar to 0.2 J/cm(2) melting is induced in the polycrystalline silicon layer and in the residual alpha-Si. (literal)
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