Direct imaging of the core-shell effect in positive temperature coefficient of resistance-BaTiO3 ceramics (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Direct imaging of the core-shell effect in positive temperature coefficient of resistance-BaTiO3 ceramics (Articolo in rivista) (literal)

Anno

• 2009-01-01T00:00:00+01:00 (literal)

Alternative label

• Fiorenza P, Lo Nigro R, Delugas P, Raineri V, Mould AG, Sinclair DC (2009)
  Direct imaging of the core-shell effect in positive temperature coefficient of resistance-BaTiO3 ceramics
  in Applied physics letters; AIP, American institute of physics, Melville, NY (Stati Uniti d'America)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Fiorenza P, Lo Nigro R, Delugas P, Raineri V, Mould AG, Sinclair DC (literal)

Pagina inizio

• 142904-1 (literal)

Pagina fine

• 142904-3 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 95 (literal)

Rivista

• Applied physics letters (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 3 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• 1. CNR, IMM, I-95121 Catania, Italy 2. Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire England (literal)

Titolo

• Direct imaging of the core-shell effect in positive temperature coefficient of resistance-BaTiO3 ceramics (literal)

Abstract

• A conductive atomic force microscopy (C-AFM) study on a positive temperature coefficient of resistance (ptcr) BaTiO3 thermistor is reported. The method provides imaging of the dielectric properties with a lateral resolution on the nanometer scale. Measurements were carried out in the temperature range of 25-250 C to study the conduction mechanisms below and above the ferroelectric-paraelectric transition at similar to 130 C. The effective thickness of the barrier regions associated with the grain-shell and grain boundaries is similar to 450-550 nm and is similar to 10% of the volume fraction of the grains. The C-AFM results therefore confirm previous impedance spectroscopy studies that show the ptcr-effect to be associated with both the grain boundaries and outer grain-shells of individual grains. (literal)

Editore

• AIP, American institute of physics (Editore)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Materiali multifunzionali, e innovativi per componenti integrati (MD.P05.003.002) (Modulo)

Autore CNR

• RAFFAELLA LO NIGRO (Unità di personale interno)
• PIETRO DAVIDE DELUGAS (Unità di personale esterno)
• PATRICK FIORENZA (Persona)
• VITO RAINERI (Persona)

Incoming links:

Autore CNR di

• VITO RAINERI (Persona)
• RAFFAELLA LO NIGRO (Unità di personale interno)
• PATRICK FIORENZA (Persona)
• PIETRO DAVIDE DELUGAS (Unità di personale esterno)

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Materiali multifunzionali, e innovativi per componenti integrati (MD.P05.003.002) (Modulo)

Editore di

• AIP, American institute of physics (Editore)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Applied physics letters (Rivista)