Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric (Articolo in rivista)

Type
Label
  • Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.microrel.2004.11.029 (literal)
Alternative label
  • Spitale E, Corso D, Crupi I, Lombardo S, Gerardi C (2005)
    Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric
    in Microelectronics and reliability
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Spitale E, Corso D, Crupi I, Lombardo S, Gerardi C (literal)
Pagina inizio
  • 895 (literal)
Pagina fine
  • 898 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 45 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • IMM, CNR, Catania, Italy; STMicroelect, Catania, Italy (literal)
Titolo
  • Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric (literal)
Abstract
  • In this paper nanocrystals memories program curves are shown and their saturation points (steady state condition) can be observed. We present a model that relates the voltage shift at the steady state (Delta V-Tss) to the gate program voltage (V-G). Starting from a good agreement between experimental data and simulations for nanocrystals memory cells with a conventional dielectric structure (SiO2), we present the estimated values of the Delta V-Tss vs V-G for different control stacks. Our investigation shows an improvement if a material with a high dielectric constant and a small conduction band-offset with respect to the SiO2, is placed between two SiO2 layers when the first of them is very thin. (literal)
Prodotto di
Autore CNR

Incoming links:


Autore CNR di
Prodotto
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it