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Measurements and simulations of charge collection efficiency of p(+)/n junction SiC detectors (Articolo in rivista)
- Type
- Label
- Measurements and simulations of charge collection efficiency of p(+)/n junction SiC detectors (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.nima.2005.03.048 (literal)
- Alternative label
Moscatelli F.; Scorzoni A.; Poggi A., Bruzzi M.; Lagomarsino S.; Mersi S.; Sciortino S.; Nipoti R. (2005)
Measurements and simulations of charge collection efficiency of p(+)/n junction SiC detectors
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Moscatelli F.; Scorzoni A.; Poggi A., Bruzzi M.; Lagomarsino S.; Mersi S.; Sciortino S.; Nipoti R. (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR, IMM, Sez Bologna, I-40129 Bologna, Italy; Univ Perugia, Ist Nazl Fis Nucl, I-06125 Perugia, Italy; Univ Perugia, DIEI, I-06125 Perugia, Italy; Dipartimento Fis, Florence, Italy (literal)
- Titolo
- Measurements and simulations of charge collection efficiency of p(+)/n junction SiC detectors (literal)
- Abstract
- Due to its excellent electrical and physical properties, silicon carbide can represent a good alternative to Si in applications like the inner tracking detectors of particle physics experiments (RD50, LHCC 2002-2003, 15 February 2002, CERN, Ginevra). In this work p(+)/n SiC diodes realised on a medium-doped (1 X 10(15) cm(-3)), 40 mu m thick epitaxial layer are exploited as detectors and measurements of their charge collection properties under beta particle radiation from a Sr-90 source are presented. Preliminary results up to 900 V reverse bias voltage show a good collection efficiency of 1700e(-) and a collection length (ratio between collected charge and generated e-h pairs/mu m) equal to the estimated width of the depleted region. Preliminary simulations on Schottky diodes have been carried out using the ISE-TCAD DESSIS simulation tool. Experimental results were reproduced well. (literal)
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