A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces (Articolo in rivista)

Type
Label
  • A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Alternative label
  • Centurioni E (2004)
    A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces
    in Solid-state electronics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Centurioni E (literal)
Pagina inizio
  • 841 (literal)
Pagina fine
  • 844 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 48 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR, IMM, Sez Bologna, I-40129 Bologna, Italy (literal)
Titolo
  • A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces (literal)
Abstract
  • A fast and simple experimental method for the electrical characterisation (current voltage curve) of metal/semi-conductor interfaces is presented, discussed and experimentally tested. The sample preparation is reduced at minimum, no ohmic contacts are needed. The method can be used to characterize Schottky diodes and metallic contacts. (literal)
Prodotto di
Autore CNR

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