http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35572
A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces (Articolo in rivista)
- Type
- Label
- A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces (Articolo in rivista) (literal)
- Anno
- 2004-01-01T00:00:00+01:00 (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR, IMM, Sez Bologna, I-40129 Bologna, Italy (literal)
- Titolo
- A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces (literal)
- Abstract
- A fast and simple experimental method for the electrical characterisation (current voltage curve) of metal/semi-conductor interfaces is presented, discussed and experimentally tested. The sample preparation is reduced at minimum, no ohmic contacts are needed. The method can be used to characterize Schottky diodes and metallic contacts. (literal)
- Prodotto di
- Autore CNR
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