Design, fabrication, and testing of an integrated Si-based light modulator (Articolo in rivista)

Type
Label
  • Design, fabrication, and testing of an integrated Si-based light modulator (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1109/JLT.2003.808608 (literal)
Alternative label
  • Sciuto A., Alessandria A., Libertino S., Coffa S., Coppola G. (2003)
    Design, fabrication, and testing of an integrated Si-based light modulator
    in Journal of lightwave technology (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Sciuto A., Alessandria A., Libertino S., Coffa S., Coppola G. (literal)
Pagina inizio
  • 228 (literal)
Pagina fine
  • 235 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 21 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Univ Catania, Dept Phys, I-95129 Catania, Italy; CNR, IMM, Sez Catania, I-95121 Catania, Italy; STMicroelect, DSG R&D, I-95121 Catania, Italy; STMicroelect, Corp R&D, I-95121 Catania, Italy; CNR, IMM, Sez Napoli, I-80125 Naples, Italy (literal)
Titolo
  • Design, fabrication, and testing of an integrated Si-based light modulator (literal)
Abstract
  • We have fabricated and characterized a novel Si-based light modulator working at the standard communication wavelength of 1.5 mum. It consists of a three-terminal bipolar mode field effect transistor integrated with a silicon rib waveguide on epitaxial Si wafers. The modulator optical channel is embodied within its vertical electrical channel. Light modulation is achieved moving a plasma of carriers inside and outside the optical channel by properly biasing the control electrode. The carriers produce an increase of the Si absorption coefficient. The devices have been fabricated using clean-room, processing. Detailed electrical characterization and device simulations confirm that strong conductivity modulation and plasma formation in the channel are achieved. The plasma distribution in the device under different bias conditions has been directly derived from emission microscopy analyses. The device performances in terms of modulation depth will be presented. (literal)
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