Linear and nonlinear optical properties of plasma-enhanced chemical-vapour deposition grown silicon nanocrystals (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Linear and nonlinear optical properties of plasma-enhanced chemical-vapour deposition grown silicon nanocrystals (Articolo in rivista) (literal)

Anno

• 2002-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1080/09500340110099199 (literal)

Alternative label

• G. Vijaya Prakash, M. Cazzanelli, Z. Gaburro, L. Pavesi, F. Iacona, G. Franzò, F. Priolo (2002)
  Linear and nonlinear optical properties of plasma-enhanced chemical-vapour deposition grown silicon nanocrystals
  in Journal of modern optics (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• G. Vijaya Prakash, M. Cazzanelli, Z. Gaburro, L. Pavesi, F. Iacona, G. Franzò, F. Priolo (literal)

Pagina inizio

• 719 (literal)

Pagina fine

• 730 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 49 (literal)

Rivista

• Journal of modern optics (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 12 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 5-6 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• INFM, Via Sommarive 14, I-38050 Trent, Italy. Univ Trento, Dipartimento Fis, I-38050 Trento, Italy CNR, IMETEM, I-95121 Catania, Italy INFM, I-95129 Catania, Italy Univ Catania, Dipartmento Fis, I-95129 Catania, Italy (literal)

Titolo

• Linear and nonlinear optical properties of plasma-enhanced chemical-vapour deposition grown silicon nanocrystals (literal)

Abstract

• We provide a systematic study on the linear and nonlinear optical properties of silicon nanocrystals (Si-nc) grown by plasma-enhanced chemical vapour deposition (PECVD). Linear optical properties, namely absorption, emission and refractive indices are reported. The sign and magnitude of both real and imaginary parts of third-order nonlinear susceptibility chi((3)) of Si-nc are measured by the Z-scan method. Closed aperture Z-scan reveals a positive nonlinearity for all the samples. From the open aperture measurements, nonlinear absorption coefficients are evaluated and attributed to two-photon absorption. Absolute values of chi((3)) are in the order of 10(-9) esu and show systematic correlation with the Si-nc size, due to quantum confinement related effects. A correlation has been made between chi((3)), nanocrystalline size, linear refractive index and optical band gap. (literal)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)

Autore CNR

• FABIO SANTO IACONA (Persona)
• GIORGIA FRANZO' (Unità di personale interno)

Incoming links:

Autore CNR di

• GIORGIA FRANZO' (Unità di personale interno)
• FABIO SANTO IACONA (Persona)

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Journal of modern optics (Rivista)