http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34420
Nanoparticles and thin film formation in ultrashort pulsed laser deposition of vanadium oxide (Articolo in rivista)
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- Nanoparticles and thin film formation in ultrashort pulsed laser deposition of vanadium oxide (Articolo in rivista) (literal)
- Anno
- 2009-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1021/jp9050947 (literal)
- Alternative label
Teghil R.; D'Alessio L.; De Bonis A.; Galasso A.; Ibris N.; Salvi A.M.; Santagata A.; Villani P. (2009)
Nanoparticles and thin film formation in ultrashort pulsed laser deposition of vanadium oxide
in The journal of physical chemistry. A; ACS, American chemical society, Washington, DC (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Teghil R.; D'Alessio L.; De Bonis A.; Galasso A.; Ibris N.; Salvi A.M.; Santagata A.; Villani P. (literal)
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- http://pubs.acs.org/doi/pdf/10.1021/jp9050947 (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Dipartimento di Chimica, UniVersità della Basilicata, Via N. Sauro 85, 85100 Potenza, Italy,
CNR-IMIP, Unità operatiVa di Potenza, Via S. Loja, Zona Industriale 85050 Tito Scalo (PZ), Italy (literal)
- Titolo
- Nanoparticles and thin film formation in ultrashort pulsed laser deposition of vanadium oxide (literal)
- Abstract
- The ultrashort pulsed laser deposition of vanadium oxide thin films has been carried out by a frequencydoubled
Nd:glass laser with a pulse duration of 250 fs. The characteristics of the plasma produced by the
laser-target interaction have been studied by ICCD imaging and optical emission spectroscopy. The results
confirm that an emitting plasma produced by ultrashort laser pulses is formed by both a primary and a secondary
component. The secondary component consists of particles with a nanometric size, and their composition
and spatial angular distribution influence the deposited films. In fact, these films, analyzed by X-ray
photoelectron spectroscopy, X-ray diffraction, scanning electron microscopy, and atomic force microscopy,
are formed by the aggregation of a large number of nanoparticles whose composition is explained by a model
based on equilibrium thermal evaporation from particles directly ejected from the target. On these basis, the
presence in the films of a mixture of V2O5 and VO2 is discussed. (literal)
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