http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34054
A Study of the Growth Mechanism of Microcristalline Thin Silicon Films Deposited at Low Temperature by SiF4-H2 PECVD (Articolo in rivista)
- Type
- Label
- A Study of the Growth Mechanism of Microcristalline Thin Silicon Films Deposited at Low Temperature by SiF4-H2 PECVD (Articolo in rivista) (literal)
- Anno
- 2004-01-01T00:00:00+01:00 (literal)
- Alternative label
M. Losurdo, M.M. Giangregorio, A. Grimaldi, P. Capezzuto, G. Bruno (2004)
A Study of the Growth Mechanism of Microcristalline Thin Silicon Films Deposited at Low Temperature by SiF4-H2 PECVD
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M. Losurdo, M.M. Giangregorio, A. Grimaldi, P. Capezzuto, G. Bruno (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Note
- ISI Web of Science (WOS) (literal)
- Titolo
- A Study of the Growth Mechanism of Microcristalline Thin Silicon Films Deposited at Low Temperature by SiF4-H2 PECVD (literal)
- Prodotto di
- Autore CNR
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