Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films (Articolo in rivista) (literal)

Anno

• 2004-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/j.tsf.2003.11.196 (literal)

Alternative label

• M. Losurdo (2004)
  Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films
  in Thin solid films (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• M. Losurdo (literal)

Pagina inizio

• 301 (literal)

Pagina fine

• 312 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni

• Thin Solid Films Volumes 455-456, 1 May 2004, Pages 301-312 The 3rd International Conference on Spectroscopic Ellipsometry (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 455 (literal)

Rivista

• Thin solid films (Rivista)

Note

• Scopu (literal)
• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR-IMIP (literal)

Titolo

• Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films (literal)

Abstract

• Spectroscopic ellipsometry is used to study the optical properties of nanostructured semiconductor oxide thin films. Various examples of models for the dielectric function, based on Lorentzian oscillators combined with the Drude model, are given based on the band structure of the analyzed oxide. With this approach, the optical properties of thin films are determined independent of the dielectric functions of the corresponding bulk materials, and correlation between the optical properties and nanostructure of thin films is investigated. In particular, in order to discuss the dependence of optical constants on grain size, CeO2 nanostructured films are considered and parameterized by two-Lorentzian oscillators or two-Tauc-Lorentz model depending on the nanostructure and oxygen deficiency. The correlation among anisotropy, crystalline fraction and optical properties parameterized by a four-Lorentz oscillator model is discussed for nanocrystalline V2O5 thin films. Indium tin oxide thin films are discussed as an example of the presence of graded optical properties related to interfacial reactivity activated by processing conditions. Finally, the example of ZnO shows the potential of ellipsometry in discerning crystal and epitaxial film polarity through the analysis of spectra and the detection of surface reactivity of the two polar faces, i.e. Zn-polarity and O-polarity (literal)

Prodotto di

• Istituto di Nanotecnologia (NANOTEC) (Istituto)
• Plasmi per la Scienza dei Materiali (MD.P03.025.001) (Modulo)

Autore CNR

• MARIA LOSURDO (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto di Nanotecnologia (NANOTEC) (Istituto)
• Plasmi per la Scienza dei Materiali (MD.P03.025.001) (Modulo)

Autore CNR di

• MARIA LOSURDO (Unità di personale interno)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Thin solid films (Rivista)

Insieme di parole chiave di

• Parole chiave di "Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films" (Insieme di parole chiave)