http://www.cnr.it/ontology/cnr/individuo/prodotto/ID327634
Synthesis and Investigation of New Materials in MIS Structures for the Development of Physical Foundations of CMOS Technologies of Nanoelectronics (Articolo in rivista)
- Type
- Label
- Synthesis and Investigation of New Materials in MIS Structures for the Development of Physical Foundations of CMOS Technologies of Nanoelectronics (Articolo in rivista) (literal)
- Anno
- 2010-01-01T00:00:00+01:00 (literal)
- Alternative label
Zenkevich, A. V.; Lebedinskii, Yu. Yu.; Matveev, Yu. A.; Barantsev, N. S.; Voronov, Yu. A.; Sogoyan, A. V.; Nevolin, V. N.; Chichkov, V. I.; Spiga, S.; Fanchulli, M. (2010)
Synthesis and Investigation of New Materials in MIS Structures for the Development of Physical Foundations of CMOS Technologies of Nanoelectronics
in Russian microelectronics
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Zenkevich, A. V.; Lebedinskii, Yu. Yu.; Matveev, Yu. A.; Barantsev, N. S.; Voronov, Yu. A.; Sogoyan, A. V.; Nevolin, V. N.; Chichkov, V. I.; Spiga, S.; Fanchulli, M. (literal)
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- ISI Web of Science (WOS) (literal)
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- Moscow Engn Phys Inst; State Tech Univ;
CNR-INFM, Laboratorio MDM (literal)
- Titolo
- Synthesis and Investigation of New Materials in MIS Structures for the Development of Physical Foundations of CMOS Technologies of Nanoelectronics (literal)
- Abstract
- Certain results of experimental investigations of recent years devoted to new materials of undergate dielectrics and gates for field-effect MOS transistors based on high-k metal oxides and metal layers, respectively, are presented. The laboratory technology of fabrication of a functional field-effect transistor based on the TaN/LaAlO(3)/Si structure is described briefly. (literal)
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