Electro-Optical Characterization of Patterned Thin Metal Film Ni2Si-4H SiC Schottky Photodiodes (Articolo in rivista)

Type
Label
  • Electro-Optical Characterization of Patterned Thin Metal Film Ni2Si-4H SiC Schottky Photodiodes (Articolo in rivista) (literal)
Anno
  • 2014-01-01T00:00:00+01:00 (literal)
Alternative label
  • M. Mazzillo, A. Sciuto, S. Marchese (2014)
    Electro-Optical Characterization of Patterned Thin Metal Film Ni2Si-4H SiC Schottky Photodiodes
    in IEEE sensors journal
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • M. Mazzillo, A. Sciuto, S. Marchese (literal)
Pagina inizio
  • 1858 (literal)
Pagina fine
  • 1863 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 15 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 3 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • R&D Ind. & Power Discrete Group, STMicroelectron., Catania, Italy CNR-IMM, Catania, Italy (literal)
Titolo
  • Electro-Optical Characterization of Patterned Thin Metal Film Ni2Si-4H SiC Schottky Photodiodes (literal)
Abstract
  • The use of healthcare sensors in portable and wearable devices has drawn increasing attention in the last few months. More particularly, the integration of ultraviolet (UV) light sensors to monitor UV sunlight radiation in next generation smartphones has been widely discussed recently. Here, we propose 4H-SiC Schottky photodiodes with three different geometries suitably designed to operate in photovoltaic condition for UV light monitoring. The electrical and optical characteristics of these devices are investigated as a function of the bias and temperature applied to the detectors. (literal)
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